A100 SPM scanning system:

The system can be equipped with various type of scanners for different working ranges

Standard scanner technical data*:

X-Y scan size:

• 100 x 100 μm (high voltage mode);
• 10 x 10 μm (low voltage mode)
• High voltage closed loop resolution: 0.4 nm
• High voltage open loop resolution: 0.1 nm
• Closed loop linearity: 0.1%.

Z scan size:

• 10 μm (high voltage mode)
• 1 μm (low voltage mode)
• Resolution: 0.1 nm (high voltage mode), 0.01 nm (low voltage mode)

Based on specific demands other scanning ranges can be combined by the user in different configurations**.

AFM Head
AFM Head with holder for commercial cantilevers. The holder can be removed to easy mount cantilevers. The head also houses laser, photodiode sensor with preamplifier.
Sample position XY range: 13 x 13 mm (different XY stages available on specific request). Z stage travel: 13 mm servo-assisted.

SPMCU - SPM Control Unit
SPM Control Unit and PC (equipped with a multi input-output board) drives the scanner, data acquisition and sample motion.
Tip to sample distance is controlled by ultra-low noise analog feedback, digitally driven by PC.
High speed and temporal precision are provided by hardware timing.

High Voltage Amplifier
HVA is an amplifier module projected to drive A-100 scanning Stage

Acquisition software
Software runs under Windows and is composed of a multi-window applications for instrument control and data acquisition. The software comes equipped with simple filters for immediate analysis of acquired images. The software controls all the parameters of the instrument.

Accessories:
A.P.E. Research has developed additional AFM tools for specific measurements modes* (EFM, MFM, STM, Phase Imaging, CAFM, KPM Nanolithography, etc...).

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* Some of the SPM techniques are requiring additional specific tools/accessories .
We can provide higher resolution scanners on specific request.
** Please contact your local distributor for specific configuration.