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Key features:

• Double optical sample observation (upright and inverted) for transparent and opaque samples
• Completely decoupled scanners for XY and Z configuration
• Large scanning ranges up to 250 μm
• Automatic tip sample approach
• High versatility for SPM and optical techniques
• Compatibility with third party scientific equipments

Working modes:

AFM Mode: supports major SPM scanning techniques: Contact AFM mode, Non-contact mode, Semi-contact mode, Phase Imaging, Lateral Force Microscopy, Force Curves Analysis, Electric properties, Magnetic Force Microscopy, etc.